About our Core
The Kleberg Advanced Microscopy Center (KAMC) Core Facility provides state-of-the-art technology in electron microscopy and advanced material characterization to support world-class research in nanotechnology, biology, chemistry, and materials sciences.
The Center features world-class instrumentation, including Helenita- the first aberration-corrected electron microscope installed in the United States that can see and chemically identify individual atoms, a Focused Ion Beam (FIB) instrument for TEM sample preparation and 3-D imaging & chemical mapping via serial slicing and various SEMs. KAMC also supports analytical studies and characterization of nanoscale systems via a high-resolution, multi-functional X-Ray Diffraction Spectroscopy (Panalytical Empyrean), Raman Spectroscopy as well as Atomic Force Microscopes.
Our core also features a computational laboratory where students and researchers can analyze images and spectral data using: Gatan Microscopy Suite software (GMS 3), JEMS for image and electron diffraction simulations, ImageJ (Fiji), ASTAR for orientation mapping, Dragonfly for XRD analysis, and other off-line software that support spectroscopy data analysis tools.
Our Resources
For our latest Rates & Fees, please visit us at iLab Homepage
Instrument Rates
| Commercial/Industry | Higher-Ed/Non-Profit | Internal | UT System/In Network | |
|---|---|---|---|---|
| JEOL JEM-2010F High-resolution Transmission Electron Microscope | ||||
| Assisted Use | $150.00 | $150.00 | $75.00 | $75.00 |
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | $100.00 | $100.00 | $50.00 | $50.00 |
| Critical Point Dryer | ||||
| Training | Inquire | Inquire | Inquire | Inquire |
| Hitachi S5500 Field-emission Scanning Electron Microscope with STEM mode (EDS available) | ||||
| Assisted Use | $150.00 | $150.00 | $75.00 | $75.00 |
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | $100.00 | $100.00 | $50.00 | $50.00 |
| Hitachi SU1510 Scanning Electron Microscope | ||||
| Assisted Use | $150.00 | $150.00 | $40.00 | $40.00 |
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | $100.00 | $100.00 | $25.00 | $25.00 |
| Horiba/Jobin Yvon iHR320 Raman Imaging Spectrometer | ||||
| Assisted Use | $150.00 | $150.00 | $40.00 | $40.00 |
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | $100.00 | $100.00 | $ 25.00 | $25.00 |
| JEOL JEM-1230 Transmission Electron Microscope | ||||
| Assisted Use | $80.00 | $80.00 | $40.00 | $40.00 |
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | $50.00 | $50.00 | $25.00 | $25.00 |
| JEOL JEM-ARM 200F Transmission Electron Microscope with STEM Cs-correction | ||||
| Assisted Use | $250.00 | $250.00 | $120.00 | $120.00 |
| Training | $250.00 | $120.00 | $120.00 | $120.00 |
| Unassisted Use | $150.00 | $150.00 | $80.00 | $80.00 |
| Leica EM CPD300 Automated Critical Point Dryer | ||||
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | Inquire | Inquire | Inquire | Inquire |
| Olympus DSX500 Opto-Digital Microscope | ||||
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | Inquire | Inquire | Inquire | Inquire |
| Panalytical Empyrean X-ray Diffractometer | ||||
| Assisted Use | $150.00 | $150.00 | $45.00 | $45.00 |
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | $100.00 | $100.00 | $35.00 | $35.00 |
| PELCO SC-7 Sputter Coater | Inquire | Inquire | Inquire | Inquire |
| Training | Inquire | Inquire | Inquire | Inquire |
| Rigaku Ultima IV X-ray Diffractometer (Out of Service due to repairs) | ||||
| Assisted Use | $150.00 | $150.00 | $15.00 | $15.00 |
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | $100.00 | $100.00 | $10.00 | $10.00 |
| Shimadzu AA6200 Atomic Absorption Spectrophotometer | ||||
| Assisted Use | Inquire | Inquire | Inquire | Inquire |
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | Inquire | Inquire | Inquire | Inquire |
| TEM Sample Ozone Cleaner | ||||
| Training | Inquire | Inquire | Inquire | Inquire |
| UMT Bruker | ||||
| Training | Inquire | Inquire | Inquire | Inquire |
| Veeco (Bruker) Innova Atomic Force Microscope | ||||
| Assisted Use | $150.00 | $ 150.00 | $40.00 | $40.00 |
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | $100.00 | $100.00 | $25.00 | $25.00 |
| Veeco (Bruker) Nanoscope Multimode V Atomic Force Microscope | ||||
| Assisted Use | $150.00 | $150.00 | $40.00 | $40.00 |
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | $100.00 | $100.00 | $25.00 | $25.00 |
| Zeiss Crossbeam 340 Focused Ion Beam Scanning Electron Microscope | ||||
| Assisted Use | $300.00 | $300.00 | $95.00 | $95.00 |
| Training | Inquire | Inquire | Inquire | Inquire |
| Unassisted Use | $300.00 | $300.00 | $60.00 | $60.00 |
Service Rates
| Commercial/Industry | Higher-Ed/Non-Profit | Internal | UT System/In Network | |
|---|---|---|---|---|
| Â Olympus DSX500 | Inquire | Inquire | Inquire | Inquire |
| Hitachi 1510 (Train/Cert) | $ 60.00 | $60.00 | $40.00 | $40.00 |
| Hitachi S5500 | $150.00 | $150.00 | $75.00 | $75.00 |
| Horiba SA-9600 – SSA | Inquire | Inquire | Inquire | Inquire |
| iHR320 Raman | $150.00 | $150.00 | $40.00 | $40.00 |
| JOEL 1230 | $80.00 | $80.00 | $40.00 | $40.00 |
| JOEL 2010 | $150.00 | $150.00 | $ 75.00 | $75.00 |
| JOEL ARM 200 | $250.00 | $250.00 | $120.00 | $120.00 |
| Panalytical XRD | $150.00 | $150.00 | $45.00 | $45.00 |
| Rigaku XRD | $150.00 | $150.00 | $15.00 | $15.00 |
| Shimadzu AA6200 – AAS | Inquire | Inquire | Inquire | Inquire |
| Veccco Innova AFM | $150.00 | $150.00 | $40.00 | $40.00 |
| Veeco NanoScope Multimode AFM | $150.00 | $150.00 | $40.00 | $40.00 |
| Zeiss FIB-SEM Crossbeam | $300.00 | $300.00 | $95.00 | $95.00 |
Training Fees
| Commercial/Industry | Higher-Ed/Non-Profit | Internal | UT System/In Network | |
|---|---|---|---|---|
| Training: Critical Point Dryer | $60.00 | $60.00 | $40.00 | $40.00 |
| Training: Hitachi S 5500 fSEM w/ STEM Mode | $450.00 | $450.00 | $300.00 | $300.00 |
| Training: Hitachi SU 1510 SEM | $180.00 | $180.00 | $120.00 | $120.00 |
| Training: Horiba SA-9600 SAA | $60.00 | $60.00 | $40.00 | $40.00 |
| Training: Horiba/Jobin Yvon iHR320 | $120.00 | $120.00 | $80.00 | $80.00 |
| Training: JEOL JEM-2010 F TEM | $787.50 | $787.50 | $525.00 | $525.00 |
| Training: JEOL JEM-ARM 200 F TEM w/ STEM Cs-Corrector | $1,260.00 | $1,260.00 | $840.00 | $840.00 |
| Training: Olympus DSX500 | $22.50 | $22.50 | $15.00 | $15.00 |
| Training: Panalytical Empyrean XRD | $540.00 | $540.00 | $360.00 | $360.00 |
| Training: Rigaku Ultima IV XRD | Inquire | Inquire | Inquire | Inquire |
| Training: Shimadzu AA6200 | $60.00 | $60.00 | $40.00 | $40.00 |
| Training: TEM Sample Ozone Cleaner | $15.00 | $15.00 | $10.00 | $10.00 |
| Training: UMT Bruker | $60.00 | $60.00 | $40.00 | $40.00 |
| Training: Veeco (Bruker) Innova AFM | $180.00 | $180.00 | $120.00 | $120.00 |
| Training: Veeco (Bruker) Nanoscope Multimode V AFM | $180.00 | $180.00 | $120.00 | $120.00 |
| Training: Zeiss Crossbeam 340 FIB EM | $721.50 | $712.50 | $475.00 | $475.00 |
Core Facility Contacts
Please email us at KAMC@utsa.edu for all inquiries.
| Core Scientific Director Ana Stevanovic, Ph.D. (210)458-8735 |
Scientific Advisory Board Chair Kelly Nash, Ph.D. (210)458-6153 |
|
| Scientific Instrumentation Coordinator Jason Guiliani, Ph.D. |
Core Facility Policies
Core Acknowledgment – If you received any services and/or used instruments within this core facility to generate data for your manuscript or grant submissions, please use the following examples to help format your acknowledgment:
“The authors acknowledge the Kleberg Advanced Microscopy Center (KAMC) Core Facility at the University of Texas at San Antonio for support during this work.”
“The authors would like to thank Dr. [FirstName LastName] of the Kleberg Advanced Microscopy Center (KAMC) Core Facility at the University of Texas at San Antonio for technical support.”
Our Mission
Our Core Facility is committed to providing our research community access to our technologies and expertise in materials characterization to enable new scientific discoveries and advancing the fields of nanotechnology, biology, chemistry, and materials sciences.
