About our Core
The Kleberg Advanced Microscopy Center (KAMC) Core Facility provides state-of-the-art technology in electron microscopy and advanced material characterization to support world-class research in nanotechnology, biology, chemistry and materials sciences.
The Center features world-class instrumentation, including Helenita- the first aberration-corrected electron microscope installed in the United States that can see and chemically identify atoms.
Our core also core features a computational laboratory where students and researchers can analyze images and spectral data using: Gatan Microscopy Suite software (GMS 3), JEMS for image and electron diffraction simulations, ImageJ (Fiji), ASTAR for orientation mapping, Dragonfly for XRD analysis, and other off-line software that support spectroscopy data analysis tools.
Our Resources
For our latest Rates & Fees, please visit us at iLab Homepage
Core Facility Contacts
Please email us at KAMC@utsa.edu for all inquiries.
| Core Scientific Director Ana Stevanovic, Ph.D. (210)458-8735 |
Scientific Advisory Board Chair Kelly Nash, Ph.D. (210)458-6153 |
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| Scientific Instrumentation Coordinator Jason Guiliani, Ph.D. |
Core Facility Policies
Core Acknowledgment – If you used the equipment within Kleberg Advanced Microscopy Center to generate data for your manuscript, please use the following examples to help format your acknowledgment.
“The authors acknowledge the Kleberg Advanced Microscopy Center (KAMC) Core Facility at the University of Texas at San Antonio for support during this work.
“The authors would like to thank Dr. FirstName LastName (Kleberg Advanced Microscopy Center (KAMC) Core Facility, University of Texas at San Antonio) for technical support”.
Our Mission
Our Core Facility is committed to providing our research community access to our technologies and expertise in materials characterization, to enable all our researchers to reach new scientific discoveries, and advance the fields of research in nanotechnology, biology, chemistry and materials sciences.
