| Sample Preparation Assistance |
60 |
N/A |
70 |
90 |
| Data Analysis |
50 |
N/A |
60 |
80 |
| Staff Rate for Instrument Assistance |
50 |
N/A |
60 |
80 |
| Hitachi 1510 SEM |
30 |
60 |
60 |
90 |
| Hitachi S5500 SEM/STEM |
60 |
90 |
120 |
180 |
| Zeiss Crossbeam FIB |
80 |
110 |
160 |
240 |
| Zeiss Crossbeam SEM |
60 |
90 |
120 |
180 |
| Veeco (Bruker) Nanoscope AFM |
30 |
60 |
60 |
90 |
| Veeco (Bruker) Innova AFM |
30 |
60 |
60 |
90 |
| JEOL ARM 200F S/TEM |
100 |
130 |
200 |
300 |
| JEOL 2010F HRTEM |
60 |
90 |
120 |
180 |
| Panalytical XRD |
45 |
75 |
90 |
135 |
| Shimadzu AA6200 Atomic Absorption Spectrometer |
20 |
50 |
40 |
60 |
| Horiba SA-966Surface Area Analyzer |
30 |
60 |
60 |
90 |
| Olympus DSX500 Opto-Digital 3D Microscope |
20 |
50 |
40 |
60 |
| Horiba Raman Imaging Spectrometer |
30 |
60 |
60 |
90 |
| PICO 155P Precision Cutter |
25 |
55 |
50 |
75 |
| NANO 1000 T Polisher |
20 |
50 |
40 |
60 |
| Cryo-plunge |
60 |
90 |
120 |
180 |
| Leica CPD300 Automated Critical Point Dryer |
15 |
45 |
30 |
45 |
| PELCO SC-7 Sputter Coater |
15 |
45 |
30 |
45 |
| Carbon Coater |
20 |
50 |
40 |
60 |
| Ultramicrotome |
70 |
100 |
140 |
210 |