Resources
The KAMC houses a suite of electron microscopes. Each room is well isolated and vibration-free. We have a dedicated team that supports training, sample preparation, imaging, and data analysis.
How to Select a Microscope
Resolution
| TEM | SEM | FIB/SEM | Light Microscope | AFM | |
|---|---|---|---|---|---|
| Training Session | 3+ | 2+ | 3+ | 0 | 2+ |
| Resolution | Å or sub-Å | nm | nm Ga FIB: < 3nm | sub-μm | lateral/vertical: nm |
Common Tasks
| Task | TEM | SEM | FIB/SEM | Light Microscope | AFM |
|---|---|---|---|---|---|
| Diffraction | Yes | No | Yes | No | No |
| Z-Contrast Imaging (STEM) | Yes | Yes | Yes | No | No |
| 2D Imaging | Yes | Yes | Yes | Yes | Yes |
| 3D Imaging |
Possible Special Holder Required |
Yes | Yes | Yes | Yes |
| Secondary Electrons | No | Yes | Yes | No | No |
| Backscatter Electrons | No | Yes | Yes | No | No |
| Large Field of View | No | Yes | Yes | No | Possible |
| EDS | Yes | Yes | Yes | No | No |
| EELS | Yes | No | No | No | No |
Sample Types
| Sample | TEM | SEM | FIB/SEM | Light Microscope | AFM |
|---|---|---|---|---|---|
| <200nm Thick | Yes | Yes | Yes | No | No |
| 500nm - 5mm thick |
Possible Additional Prep Required |
Yes | Yes | Yes | Yes |
| 5mm - 100mm Wide | No | Yes | Yes | Yes | No |
| Biological | Yes | Yes | Yes | Yes | Yes |
| Non-Conductive |
Possible Additional Prep Required |
Yes | Yes | Yes |
Possible Additional Prep Required |
| Hydrated | No | Yes | Yes | Yes | Yes |
Instruments
- Hitachi SU 1510 Scanning Electron Microscope
- Hitachi S 5500 Field-Emission Scanning Electron Microscope with STEM Mode
- JEOL JEM-ARM 200 F Transmission Electron Microscope with STEM Cs-Corrector
- JEOL JEM-1230 Transmission Electron Microscope
- JEOL JEM-2010 F Transmission Electron Microscope
- Zeiss Crossbeam 340 Focused Ion Beam Scanning Electron Microscope
- Sample Preparation Tools
Instrumentations
- Horiba/Jobin Yvon iHR320 Raman Imaging Spectrometer
- Horiba SA-9600 Surface Area Analyzer
- Olympus DSX500 Opto-Digital Microscope
- Panalytical Empyrean X-Ray Diffractometer
- Rigaku Ultima IV X-Ray Diffractometer
- Shimadzu AA6200 Atomic Absorption Spectrometer
- Veeco (Bruker) Innova Atomic Force Microscope
- Veeco (Bruker) Nanoscope Multimode V Atomic Force Microscope
Software
- Gatan Digital Micrograph
- ImageJ
- ASTAR for orientation mapping
- Dragonfly for XRD Analysis
- International Center for Diffraction Data (ICDD)
- OriginPro
- JEMS for image and electron diffraction simulations