Instrumentation

Location: Main Campus, Flawn Sciences Building - FLN Room 1.01.28

The sub-nanometer field-emission Scanning Electron Microscope (SEM) has the capability to also operate as a Transmission Electron Microscope (TEM) in a scanning mode (STEM). This dual SEM & STEM microscope can reach the world’s highest resolution of 0.4 nm at 30 kV using the secondary electron detector. It simultaneously provides surface topography (SE mode) in conjunction with the bulk information (STEM mode) making 3-D morphological observations possible. The STEM mode uses brightfield and darkfield detectors enabling crystal lattice resolution and true Z-contrast imaging for different material composition and thickness. This SEM & STEM is equipped with a Bruker EDX detector supporting the chemical analysis of both thin and bulk sample areas. Available EDX modes are line scanning and 2D mapping. The low voltage microscope is ideal for imaging beam sensitive materials and of extreme interest to both Materials and Life Sciences. Investigation of biological materials may be imaged in an unstained condition.

Features:

• Source: Cold cathode field emission
• Acceleration voltage: 0.5 kV to 30 kV
• Secondary Electron Detector
• Backscattered Electron Detector
• Automated YAG backscattered Electron Detector
• STEM detector (bright field / dark field)
• Resolution: 0.4 nm (30 kV, sample height 1.0 mm, 800kX),
  1.6 nm (1 kV, sample height 2.0 mm, 180kX)
• Specimen holder: Standard STD holder
• Maximum Sample Size: 5 mm x 9 mm x 3 mm (height)

Attached equipment:

• Solid-state EDS Detector Bruker Quantax, Esprit software.

Data provided:

• SE imaging- Topography of the sample surface
• BSE imaging- Information on the sample composition, crystallography, distinguishing phases, porosity
• Low kV STEM detectors- Crystal lattice resolution, Z-contrast imaging
• Elemental identification and mapping

Location: Flawn Sciences Building - FLN Room 1.01.28
Variable Pressure Scanning Electron Microscope is a general-purpose SEM for advanced laboratory studies. It houses an EDS detector that allows for elemental analysis. The microscope can be used to image a range of different materials, including metals, plastics, composites, foods, textiles, glass, and paper, as well as hydrated specimens relevant to biosciences, life sciences, and medicine.

Features:

• High-vacuum mode: 1.5 x 10-3 Pa
• Variable-pressure mode: 6 - 270 Pa
• Source: Tungsten hairpin filament
• Acceleration voltage: 0.3 kV to 30 kV
• Secondary Electron Detector (high vacuum mode)
• Back-scattered Electron Detector (High/Low vacuum mode)
• Resolution:
  SE Mode: 50 nm (30 kV, 5mm WD, High Vacuum)
  100nm (3 kV, 5 mm WD, High Vacuum)
  BSE Mode: 50nm (30 kV, 5 mm WD, 6 Pa)
• Sample size: 5 cm x 5 cm x 5 cm (height) at maximum

Attached equipment:

• EDS Detector EDAX Apollo (WD= 15 mm, TOA =35°), TEAM software.

Data provided:

• SE imaging (high vacuum mode)- Sample topography
• BSE imaging (High/Low vacuum mode)- Sample 3D morphology, porosity, alignment of protein scaffolds, etc.
• Elemental identification and mapping
  Data acquisition software: Quartz PCI, EDAX Team.

Location: Flawn Sciences Building - FLN Room 1.01.28

The JEM-ARM 200F Atomic Resolution Analytical Microscope is a 200 kV transmission electron microscope (TEM). It is equipped with a STEM Cs corrector and is capable of reaching a spatial resolution of 0.78 Å in STEM mode and 1.2 Å in the TEM mode at 200 kV.
The microscope is equipped with bright field (BF), annular dark field (ADF), energy-dispersive X-ray spectroscopy (EDS) and electron energy loss spectroscopy (EELS) detectors. The flexible condenser system permits convergent beam diffraction (CBD) and nano-diffraction (ND) in TEM and STEM modes.
This microscope allows for STEM diffraction, electron holography and in situ measurements.

Features:

• Imaging Modes: TEM/STEM
• Voltage: 80, 120, 200 kV
• Cs: 0.5 mm CEOS hexapole.
• Resolution: 0.78 Å (STEM 200kV) / 1.2 Å (TEM 200kV)
• Source: Field Emission Gun
• Lorentz lens
• Sample holder: single tilt / double tilt / optical holder

Attached Equipment:

• JEOL BF / HAADF detectors
• Gatan Multiscan Camera
• EDS detector EDAX Apollo
• Gatan energy filter with EELS
• Electron biprism

Data Provided:

• Atomic-level imaging in STEM (BF/HAADF)
• Lattice imaging (HRTEM)
• Electron Diffraction (PED, SAED, NBD, CBD)
• Elemental identification and mapping (EDS and EELS)

Location: Flawn Sciences Building - FLN Room 1.01.28

The crossbeam combines the field emission SEM performance with a Focused Ion Beam (FIB). This system achieves a high resolution in both SEM and STEM mode and it has the ability to mill and image simultaneously. It also has five injector sources for film deposition. Suitable for sample preparation, and FIB-milling with a uniform high resolution. Typical applications: TEM Lamella, Cross-sectioning and Tomography, 3D Analytics, and Nanopatterning. The instrument has a detector for chemical analysis (EDS), dark field and bright field for imaging in STEM mode and backscattered electrons.

Features:

• Resolution:
  1.9 nm @1 kV SEM mode;
  1.0 nm @15 kV SEM mode;
  0.9 nm @30 kV –STEM mode
• Film deposition sources: W, Pt, SiO, C, and XeF2
• Ga FIB resolution: < 3 nm
• Beam current: 1 pA – 100 nA

Attached equipment:

• EDS detector- for chemical analysis
• BSE detector- SEM imaging
• Bright/darkfield detector- STEM imaging

Typical Application:

• TEM sample preparation: TEM lamella
• Cross-sectioning and Tomography
• 3D Analytics
• Nano pattering
• Chemical analysis
• SEM and STEM imaging

Location: Flawn Sciences Building - FLN Room 1.01.24

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The field-emission JOEL 2010 TEM provides high-resolution atomic lattice imaging in TEM mode. It’s capable of imaging electron diffraction and convergent electron beam diffraction patterns. This microscope is great for materials and life sciences where high resolution of ~ 1.9 Å is preferred. Elemental analysis by X-ray energy dispersive spectrometry (EDS) is also available.

Features:

• Imaging mode: TEM
• Voltage: 120, 200kV
• Source: Field Emission Gun
• Resolution: 1.9 Å
• Specimen holder: single tilt / double tilt.

Attached equipment:

• TVIPS CMOS camera
• SiLi EDS Detector. EDAX Genesis

Data acquisition software:

• TVIPS EMMenu
• EDAX Genesis

Data provided:

• Atomic lattice imaging (HRTEM)
• Bright-field (BF)and Annual Dark Field (DF) imaging
• Electron Diffraction (SAED, NBD, CBD)
• Elemental Analysis (EDS)

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Location: Flawn Sciences Building - FLN Room 1.01.28

The JEOL JEM-1230 is high contrast, 40 -120 kV transmission electron microscope. This low voltage electron microscope is excellent for electron beam sensitive specimens. Ideal for biological and life sciences.

Features:

• High contrast configuration
• Source: Tungsten hairpin filament
• Resolution: 0.4 nm (point)
• Acceleration Voltage: 80, 100, 120 kV
• Specimen holder: single tilt.

Attached equipment:

• AMT camera with AMT-V600 software

Data acquisition software:

• GATAN Digital Micrograph

Data provided:

• Phase-contrast imaging
• Electron Diffraction (SAED)

Location: Applied Engineering and Technology Building - AET Room 3.228B

Horiba Raman Imaging Spectrometer is equipped with three different lasers in combination with an optical microscope for chemical imaging. The Raman images & spectra provide information about individual chemical components, phases, and variation in crystallinity in materials. This imaging spectrometer can be used for a variety of applications, including characterization of materials, pharmaceutics, forensics, geology, biological and life sciences.

Features:

• iHR 320 spectrometer
• Lasers: Red (785 nm), Green (532 nm), Blue (473 nm)
• Motorized X-Y mapping stage for Raman mapping

Data acquisition software:

• LabSpec 6 data acquisition and analysis software

Location: Applied Engineering and Technology Building - AET Room 3.232

Panalytical Empyrean is a state-of-art multipurpose X-ray diffractometer that allows for diffraction measurements on (1) powders, (2) liquid dispersions, (3) thin films, (4) nanomaterials, and (5) solid objects. The diffractometer is equipped with two detectors: a standard proportional detector and a PIXcel3D detector. Empyrean offers a versatile platform for a large range of advanced X-ray analytical techniques which include phase determination, Rietveld quantitative analysis, small- and wide-angle X-ray scattering (SAXS/WAXS) under low-vacuum conditions, grazing-incidence angle SAXS (GISAXS), texture and stress, micro X-ray diffraction (µXRD), thin-film analysis, computed tomography and non-ambient analysis with the Anton-Paar DHS 1100 domed heated stage.

Features:

• Cu Kα X-ray wavelength
• Vertical θ/θ goniometer
• 2θ measuring range -3° to 162°
• Vacuum chamber for SAXS & WAXS
• Computed tomography stage
• Heating capabilities
• PIXCEL3D area and standard proportional counter X-ray detectors
• HighScore Plus software
• ICDD PDF-4 and PDF-2 reference databases

Data provided:

• Powder characterization- phase identification
• Thin-film characterization:
  • Grazing incidence XRD for surface analysis and depth profiling
  • Rocking curve and reciprocal space maps for epitaxial layer analysis
  • X-ray reflectometry for determination of thickness, density and roughness of thin films
  • XRD at elevated T= 25-1100° for in situ studies of advanced thin-film materials
• Residual stress for component and failure analysis
• Micro XRD (µXRD)

Location: Applied Engineering and Technology Building - AET Room 3.232

X-ray diffraction Rigaku Ultima IV is an XRD system that allows for powder in various environments: elevated temperature, vacuum, gas, liquid or l-N2 cooling condition. Parallel and focused beam modes. Small-angle X-ray scattering (SAXS) capabilities.

Features:

• Cu Kα X-ray wavelength
• Vertical θ / θ q goniometer
• 2 θ measuring range -3 °C to 162 °C
• Minimum step size 0.0001 °C
• Computer-controlled, programmable automatic variable slits
• A standard stage for powder XRD
• Thin-film stage
• Scintillation counter X-ray detector
• ICDD PDF-4 and PDF-2 reference databases

Data provided:

• Powder characterization- phase identification
• SAXS
• In situ ambient experiments

Location: Applied Engineering and Technology Building - AET Room 3.232

The Shimadzu AA-6200 Atomic Absorption Double-Beam Spectrophotometer enables measurement of elements at very low concentrations (typically in the parts per million).

Features:

• Optics: Double Beam (chopper mirror)
• Superior baseline stability
• Wavelength range: 190-900 nm
• Flame Burner: Air/C2H2
• Element Hollow Cathode Lamps:
  • Ag, Au, Co, Cu, Fe, Ni, Pt, Pb, Pd, Rh, Ru, Se, Te, Zn

Location: Applied Engineering and Technology Building - AET Room 3.238

The Horiba SA-9600 flowing gas BET surface area is an instrument that measures the specific surface area and the pore size distribution of powders, solids, and granules. The specific surface area/pore size of a material is estimated from the amount of adsorbed/desorbed N2 gas in a relationship with its pressure at 77 K as described by BET theory. The values are expressed in meter square per gram.

This instrument can measure BET in the range 0.01 – 2,000 m2/g. Ideal for characterizing:

• MOFs,
• zeolites,
• metal oxides,
• activated carbon
• other catalytic materials

Location: Applied Engineering and Technology Building - AET Room 3.228B

This Atomic Force Microscope delivers high-resolution imaging and a wide range functionality for materials and polymer science, biological research and nonelectrical measurements. The scanning probe microscopy is capable of working in situ inside liquids, addressing biological samples ranging from biomolecules, isolated membranes, and whole live cells. Veeco Innova is a multimode microscope with functionalities listed below.

Features:

• Large area 100 mm x 100 mm piezoelectric scanner
• Maximum lateral scan range: > 90 mm
• Maximum vertical scan range: 3 mm
• Maximum sample size: ~ 45 mm x ~ 45 mm x 18 mm (thick)
• Maximum number of data points in X and Y: 1024
• SPMLab image analysis software

Data provided:

• Tapping Mode Imaging – Measures height by tapping the surface with an oscillating tip.
• Contact Mode Imaging – Measures height by sliding the probe across and in contact with the sample surface.
• Conductive Mode Imaging – Images conductivity variations across medium- to low-conducting and semiconducting materials (currents from pA to A).

Location: Applied Engineering and Technology Building - AET Room 3.228B

The Veeco Nanoscope V Multimode AFM performs the full range of scanning probe techniques
to measure surface characteristics such as surface topography, elasticity, friction, adhesion, magnetic and electrical fields.

Features:

• 15 x 15-micron piezoelectric scanner
• Maximum lateral scan range: 15 mm
• Maximum vertical scan range: 3 mm
• Maximum sample size: ~ 15 mm x ~ 15 mm x 8 mm (thick)
• Maximum number of data points in X and Y: 512
• NanoScope image analysis software
• Thermal Applications Controller – Enables AFM at elevated temperatures (up to 150° C)

Software:

• Nanoscope

Data provided:

• Tapping Mode Imaging – Measures height by tapping the surface with an oscillating tip.
• Contact Mode Imaging – Measures height by sliding a probe across and in contact with the sample surface.
• Phase Imaging – provides image contrast caused by differences in surface adhesion and viscoelasticity.
• Magnetic Force Microscopy (MFM) – Measures magnetic force gradient distribution above the sample surface.
• Liquid Imaging – Measures samples in liquids using either contact or tapping mode operation.
• Electric Force Microscopy – Measures electric field gradient distribution above the sample surface.
• Conductive Mode Imaging (CAFM) – Characterizes conductivity variations across medium- to low-conducting and semiconducting materials (current from pA to A).
• Force Modulation Imaging – Measures relative elasticity/stiffness of surface features.
• Nanoindentation – Measures mechanical properties by nanoindenting a sample with an AFM tip to investigate hardness.

Location: Applied Engineering and Technology Building - AET Room 3.228B

The DSX500 gives you an optical zoom up to 13x and a digital zoom all the way to 30x. The microscope has a large field of view which does not reduce with increasing magnification. Panoramic View maintains the original field of view during closeup imaging. The samples can be viewed in 3D space and examine from any angle by moving the stage via a touch screen.

Data provided:

• 3D Imaging - detailed images in three dimensions
• Bright Field Imaging – the most common method with optical microscopes
• Dark Field Imaging – illuminates from the side to emphasize imperfections
• Mix (BF + DR) Imaging – combines BF ease of observation and DF ease of detection
• Differential Interference Contrast (DIC) imaging – to inspecting uneven surfaces
• Polarized Light (PO) imaging –for eliminating glaze on substrates
• WiDER – enables imaging of sample with high reflectance differences
• Extended Focal Imaging (EFI) - in-focus image of an entire sample with one click, no matter how uneven the surface

Location AET 3.228

The Leica EM CPD300 Automate Critical Point Dryer allows for the preparation of biological samples for electron microscopy characterization via drying in supercritical carbon dioxide. Biological samples that have undergone fixation and prior dehydration (e.g., in ethanol) can be fully dried via critical point drying. This instrument allows for reproducible results with the ability to store and recall drying recipes and programs using a touchscreen interface. The drying chamber is designed to hold filter discs, porous pots, fine-mesh specimen baskets, cover slips, grids, etc.