Instrumentation
Location: Main Campus, Flawn Sciences Building - FLN Room 1.01.28
The sub-nanometer field-emission Scanning Electron Microscope (SEM) has the capability to also operate as a Transmission Electron Microscope (TEM) in a scanning mode (STEM). This dual SEM & STEM microscope can reach the world’s highest resolution of 0.4 nm at 30 kV using the secondary electron detector. It simultaneously provides surface topography (SE mode) in conjunction with the bulk information (STEM mode) making 3-D morphological observations possible. The STEM mode uses brightfield and darkfield detectors enabling crystal lattice resolution and true Z-contrast imaging for different material composition and thickness. This SEM & STEM is equipped with a Bruker EDX detector supporting the chemical analysis of both thin and bulk sample areas. Available EDX modes are line scanning and 2D mapping. The low voltage microscope is ideal for imaging beam sensitive materials and of extreme interest to both Materials and Life Sciences. Investigation of biological materials may be imaged in an unstained condition.




Features:
- Source: Cold cathode field emission
- Acceleration voltage: 0.5 kV to 30 kV
- Secondary Electron Detector
- Backscattered Electron Detector
- Automated YAG backscattered Electron Detector
- STEM detector (bright field / dark field)
- Resolution: 0.4 nm (30 kV, sample height 1.0 mm, 800kX),
1.6 nm (1 kV, sample height 2.0 mm, 180kX) - Specimen holder: Standard STD holder
- Maximum Sample Size: 5 mm x 9 mm x 3 mm (height)
Attached equipment:
- Solid-state EDS Detector Bruker Quantax, Esprit software.
Data provided:
- SE imaging- Topography of the sample surface
- BSE imaging- Information on the sample composition, crystallography, distinguishing phases, porosity
- Low kV STEM detectors- Crystal lattice resolution, Z-contrast imaging
- Elemental identification and mapping



