Instrumentation

Location: Main Campus, Flawn Sciences Building - FLN Room 1.01.28

The sub-nanometer field-emission Scanning Electron Microscope (SEM) can also operate as a Transmission Electron Microscope (TEM) in a scanning mode (STEM). This dual SEM & STEM microscope can reach the world’s highest resolution of 0.4 nm at 30 kV using the secondary electron detector. It simultaneously provides surface topography (SE mode) in conjunction with bulk information (STEM mode) making 3-D morphological observations possible.

The STEM mode uses brightfield and darkfield detectors enabling crystal lattice resolution and true Z-contrast imaging for different material composition and thickness. This SEM & STEM is equipped with a Bruker EDX detector supporting the chemical analysis of both thin and bulk sample areas. Available EDX modes are line scanning and 2D mapping.

The low-voltage microscope is ideal for imaging beam-sensitive materials and is of extreme interest to both Materials and Life Sciences. Investigation of biological materials may be imaged in an unstained condition.

Features:

• Source: Cold cathode field emission
• Acceleration voltage: 0.5 kV to 30 kV
• Secondary Electron Detector
• Backscattered Electron Detector
• Automated YAG backscattered Electron Detector
• STEM detector (bright field / dark field)
• Resolution: 0.4 nm (30 kV, sample height 1.0 mm, 800kX),
  1.6 nm (1 kV, sample height 2.0 mm, 180kX)
• Specimen holder: Standard STD holder
• Maximum Sample Size: 5 mm x 9 mm x 3 mm (height)

Attached equipment:

• Solid-state EDS Detector Bruker Quantax, Esprit software.

Data provided:

• SE imaging- Topography of the sample surface
• BSE imaging- Information on the sample composition, crystallography, distinguishing phases, porosity
• Low kV STEM detectors- Crystal lattice resolution, Z-contrast imaging
• Elemental identification and mapping

• Atomic-resolution STEM imaging — BF and HAADF
• High-resolution TEM (HRTEM) - lattice and structural imaging
• Electron diffraction - SAED, NBD, CBED, and PED
• EDS analysis — elemental identification and nanoscale compositional mapping, including improved detection of light elements.
• Electron holography — characterization of electrostatic and magnetic fields
  
  
  

  

  

Location: Flawn Sciences Building - FLN Room 1.01.24

The crossbeam combines the field emission SEM performance with a Focused Ion Beam (FIB). This system achieves a high resolution in both SEM and STEM mode and it has the ability to mill and image simultaneously. It also has five injector sources for film deposition. Suitable for sample preparation, and FIB-milling with a uniform high resolution. Typical applications: TEM Lamella, Cross-sectioning and Tomography, 3D Analytics, and Nanopatterning. The instrument has a detector for chemical analysis (EDS), dark field and bright field for imaging in STEM mode and backscattered electrons.

Features:

• Resolution:
  1.9 nm @1 kV SEM mode;
  1.0 nm @15 kV SEM mode;
  0.9 nm @30 kV –STEM mode
• Film deposition sources: W, Pt, SiO, C, and XeF2
• Ga FIB resolution: < 3 nm
• Beam current: 1 pA – 100 nA

Attached equipment:

• EDS detector- for chemical analysis
• BSE detector- SEM imaging
• Bright/darkfield detector- STEM imaging

Typical Application:

• TEM Sample Preparation
• Cross-Sectioning
• Nanoscale Elemental Analysis
• Phase & Crystallographic Analysis
• In Situ Nanoindentation
• In Situ Heating up to 950°C

Location: Flawn Sciences Building - FLN Room 1.01.24

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The field-emission JOEL 2010 TEM provides high-resolution atomic lattice imaging in TEM mode. It’s capable of imaging electron diffraction and convergent electron beam diffraction patterns. This microscope is great for materials and life sciences where high resolution of ~ 1.9 Å is preferred. Elemental analysis by X-ray energy dispersive spectrometry (EDS) is also available.

Features:

• Imaging mode: TEM
• Voltage: 120, 200kV
• Source: Field Emission Gun
• Resolution: 1.9 Å
• Specimen holder: single tilt / double tilt.

Attached equipment:

• TVIPS CMOS camera
• SiLi EDS Detector. EDAX Genesis

Data acquisition software:

• TVIPS EMMenu
• EDAX Genesis

Data provided:

• Atomic lattice imaging (HRTEM)
• Bright-field (BF)and Annual Dark Field (DF) imaging
• Electron Diffraction (SAED, NBD, CBD)
• Elemental Analysis (EDS)

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Measure local mechanical properties while observing deformation in real time inside the SEM.

The Oxford Instruments FemtoTools FT-NMT04 is an in situ nanomechanical testing system for nanoindentation inside a scanning electron microscope. It combines precise force–displacement measurements with high-resolution SEM imaging, enabling site-specific mechanical testing of individual grains, phases, coatings, interfaces, and other microscopic features.

Key Capabilities
Measure localized hardness and elastic modulus at the micro- and nanoscale.

Nanoindentation Mapping
Map variations in mechanical properties across heterogeneous materials, individual phases, interfaces, coatings, and microstructures.

Real-Time SEM Imaging
Directly observe indenter positioning, surface contact, deformation, and the resulting indentation impression.

Site-Specific Testing
Precisely target individual grains, inclusions, phases, interfaces, or other features identified by SEM imaging.

Applications
Metals and alloys • Ceramics • Thin films and coatings • Composites • Semiconductor materials • Additively manufactured materials • Geological and planetary samples

KAMC now offers in situ SEM heating using the Gatan Murano heating stage (Model 525). This system enables real-time observation of microstructural evolution, phase transformations, and crystallization processes while heating bulk specimens up to 950 °C directly inside the SEM chamber.

Designed for compatibility with EBSD, secondary electron imaging, and FIB geometries, the stage features water cooling, heat shielding, and bias control to maintain image quality at elevated temperatures.

This capability supports dynamic materials research—including high-temperature behavior of alloys, steels, and advanced materials—providing critical insights that cannot be obtained from post-mortem analysis alone.

The GIGA-S Vibratory Polisher provides high-quality final surface preparation for materials requiring minimal deformation and excellent surface finish.

Its controlled vibratory polishing action is particularly well suited for preparing samples for EBSD, SEM imaging, nanoindentation, and other surface-sensitive characterization techniques. The system helps reduce mechanical deformation, smearing, and surface damage introduced during conventional grinding and polishing.

The GIGA-S can accommodate a wide range of materials, including metals, ceramics, composites, minerals, semiconductors, and other delicate or heterogeneous specimens, making it a versatile tool for advanced microscopy and materials characterization at KAMC.

Location: Applied Engineering and Technology Building - AET Room 3.228B

Horiba Raman Imaging Spectrometer is equipped with three different lasers in combination with an optical microscope for chemical imaging. The Raman images & spectra provide information about individual chemical components, phases, and variation in crystallinity in materials. This imaging spectrometer can be used for a variety of applications, including characterization of materials, pharmaceutics, forensics, geology, biological and life sciences.

Features:

• iHR 320 spectrometer
• Lasers: Red (785 nm), Green (532 nm), Blue (473 nm)
• Motorized X-Y mapping stage for Raman mapping

Data acquisition software:

• LabSpec 6 data acquisition and analysis software

Location: Applied Engineering and Technology Building - AET Room 3.232

Panalytical Empyrean is a state-of-art multipurpose X-ray diffractometer that allows for diffraction measurements on (1) powders, (2) liquid dispersions, (3) thin films, (4) nanomaterials, and (5) solid objects. The diffractometer is equipped with two detectors: a standard proportional detector and a PIXcel3D detector. Empyrean offers a versatile platform for a large range of advanced X-ray analytical techniques which include phase determination, Rietveld quantitative analysis, small- and wide-angle X-ray scattering (SAXS/WAXS) under low-vacuum conditions, grazing-incidence angle SAXS (GISAXS), texture and stress, micro X-ray diffraction (µXRD), thin-film analysis, computed tomography and non-ambient analysis with the Anton-Paar DHS 1100 domed heated stage.

Features:

• Cu Kα X-ray wavelength
• Vertical θ/θ goniometer
• 2θ measuring range -3° to 162°
• Vacuum chamber for SAXS & WAXS
• Computed tomography stage
• Heating capabilities
• PIXCEL3D area and standard proportional counter X-ray detectors
• HighScore Plus software
• ICDD PDF-4 and PDF-2 reference databases

Data provided:

• Powder characterization- phase identification
• Thin-film characterization:
  • Grazing incidence XRD for surface analysis and depth profiling
  • Rocking curve and reciprocal space maps for epitaxial layer analysis
  • X-ray reflectometry for determination of thickness, density and roughness of thin films
  • XRD at elevated T= 25-1100° for in situ studies of advanced thin-film materials
• Residual stress for component and failure analysis
• Micro XRD (µXRD)

Location: Applied Engineering and Technology Building - AET Room 3.238

The Shimadzu AA-6200 Atomic Absorption Double-Beam Spectrophotometer enables measurement of elements at very low concentrations (typically in the parts per million).

Features:

• Optics: Double Beam (chopper mirror)
• Superior baseline stability
• Wavelength range: 190-900 nm
• Flame Burner: Air/C2H2
• Element Hollow Cathode Lamps:
  • Ag, Au, Co, Cu, Fe, Ni, Pt, Pb, Pd, Rh, Ru, Se, Te, Zn

Location: Applied Engineering and Technology Building - AET Room 3.232

The Horiba SA-9600 flowing gas BET surface area is an instrument that measures the specific surface area and the pore size distribution of powders, solids, and granules. The specific surface area/pore size of a material is estimated from the amount of adsorbed/desorbed N2 gas in a relationship with its pressure at 77 K as described by BET theory. The values are expressed in meter square per gram.

This instrument can measure BET in the range 0.01 – 2,000 m2/g. Ideal for characterizing:

• MOFs,
• zeolites,
• metal oxides,
• activated carbon
• other catalytic materials

Location: Applied Engineering and Technology Building - AET Room 3.228B

This Atomic Force Microscope delivers high-resolution imaging and a wide range functionality for materials and polymer science, biological research and nonelectrical measurements. The scanning probe microscopy is capable of working in situ inside liquids, addressing biological samples ranging from biomolecules, isolated membranes, and whole live cells. Veeco Innova is a multimode microscope with functionalities listed below.

Features:

• Large area 100 mm x 100 mm piezoelectric scanner
• Maximum lateral scan range: > 90 mm
• Maximum vertical scan range: 3 mm
• Maximum sample size: ~ 45 mm x ~ 45 mm x 18 mm (thick)
• Maximum number of data points in X and Y: 1024
• SPMLab image analysis software

Data provided:

• Tapping Mode Imaging – Measures height by tapping the surface with an oscillating tip.
• Contact Mode Imaging – Measures height by sliding the probe across and in contact with the sample surface.
• Conductive Mode Imaging – Images conductivity variations across medium- to low-conducting and semiconducting materials (currents from pico amps (pA) to micro amps (mA)).

Location: Applied Engineering and Technology Building - AET Room 3.228B

The Veeco Nanoscope V Multimode AFM performs the full range of scanning probe techniques
to measure surface characteristics such as surface topography, elasticity, friction, adhesion, magnetic and electrical fields.

Features:

• 15 x 15-micron piezoelectric scanner
• Maximum lateral scan range: 15 mm
• Maximum vertical scan range: 3 mm
• Maximum sample size: ~ 15 mm x ~ 15 mm x 8 mm (thick)
• Maximum number of data points in X and Y: 512
• NanoScope image analysis software
• Thermal Applications Controller – Enables AFM at elevated temperatures (up to 150° C)

Software:

• Nanoscope

Data provided:

• Tapping Mode Imaging – Measures height by tapping the surface with an oscillating tip.
• Contact Mode Imaging – Measures height by sliding a probe across and in contact with the sample surface.
• Phase Imaging – provides image contrast caused by differences in surface adhesion and viscoelasticity.
• Magnetic Force Microscopy (MFM) – Measures magnetic force gradient distribution above the sample surface.
• Liquid Imaging – Measures samples in liquids using either contact or tapping mode operation.
• Electric Force Microscopy – Measures electric field gradient distribution above the sample surface.
• Conductive Mode Imaging (CAFM) – Characterizes conductivity variations across medium- to low-conducting and semiconducting materials (currents from pico amps (pA) to micro amps (mA)).
• Force Modulation Imaging – Measures relative elasticity/stiffness of surface features.
• Nanoindentation – Measures mechanical properties by nanoindenting a sample with an AFM tip to investigate hardness.

Location: Applied Engineering and Technology Building - FLN 1.01.24

The DSX500 gives you an optical zoom up to 13x and a digital zoom all the way to 30x. The microscope has a large field of view which does not reduce with increasing magnification. Panoramic View maintains the original field of view during closeup imaging. The samples can be viewed in 3D space and examine from any angle by moving the stage via a touch screen.

Data provided:

• 3D Imaging - detailed images in three dimensions
• Bright Field Imaging – the most common method with optical microscopes
• Dark Field Imaging – illuminates from the side to emphasize imperfections
• Mix (BF + DR) Imaging – combines BF ease of observation and DF ease of detection
• Differential Interference Contrast (DIC) imaging – to inspecting uneven surfaces
• Polarized Light (PO) imaging –for eliminating glaze on substrates
• WiDER – enables imaging of sample with high reflectance differences
• Extended Focal Imaging (EFI) - in-focus image of an entire sample with one click, no matter how uneven the surface

Location FLN 1.01.24

The Leica EM CPD300 Automated Critical Point Dryer allows for the preparation of biological samples for electron microscopy characterization via drying in supercritical carbon dioxide. Biological samples that have undergone fixation and prior dehydration (e.g., in ethanol) can be fully dried via critical point drying. This instrument allows for reproducible results with the ability to store and recall drying recipes and programs using a touchscreen interface. The drying chamber is designed to hold filter discs, porous pots, fine-mesh specimen baskets, cover slips, grids, etc.