Sample Preparation Assistance |
60 |
N/A |
70 |
90 |
Data Analysis |
50 |
N/A |
60 |
80 |
Staff Rate for Instrument Assistance |
50 |
N/A |
60 |
80 |
Hitachi 1510 SEM |
30 |
60 |
60 |
90 |
Hitachi S5500 SEM/STEM |
60 |
90 |
120 |
180 |
Zeiss Crossbeam FIB |
80 |
110 |
160 |
240 |
Zeiss Crossbeam SEM |
60 |
90 |
120 |
180 |
Veeco (Bruker) Nanoscope AFM |
30 |
60 |
60 |
90 |
Veeco (Bruker) Innova AFM |
30 |
60 |
60 |
90 |
JEOL ARM 200F S/TEM |
100 |
130 |
200 |
300 |
JEOL 2010F HRTEM |
60 |
90 |
120 |
180 |
Panalytical XRD |
45 |
75 |
90 |
135 |
Shimadzu AA6200 Atomic Absorption Spectrometer |
20 |
50 |
40 |
60 |
Horiba SA-966Surface Area Analyzer |
30 |
60 |
60 |
90 |
Olympus DSX500 Opto-Digital 3D Microscope |
20 |
50 |
40 |
60 |
Horiba Raman Imaging Spectrometer |
30 |
60 |
60 |
90 |
PICO 155P Precision Cutter |
25 |
55 |
50 |
75 |
NANO 1000 T Polisher |
20 |
50 |
40 |
60 |
Cryo-plunge |
60 |
90 |
120 |
180 |
Leica CPD300 Automated Critical Point Dryer |
15 |
45 |
30 |
45 |
PELCO SC-7 Sputter Coater |
15 |
45 |
30 |
45 |
Carbon Coater |
20 |
50 |
40 |
60 |
Ultramicrotome |
70 |
100 |
140 |
210 |